TMTeck Instrument Co., Ltd
TMTeck Instrument Co., Ltd
Add to Cart
Eddy Current Probe
Probe for special purpose could be customized. Appearance of ET probe can be in
accordance to contour of the object, or that of the where the probe is fixed in the holder,
which guarantee efficient and reliable inspection.
Specifications:
| Description | Frequency | Type |
| Pen-type Shielded Probe | 50～ 500K | Differential |
| Pen-type Shielded Probe | 500k～ 3M | Differential |
| Pen-type Non-Shielded Probe | 50～ 500K | Differential |
| Pen-type Non-Shielded Probe | 500k～ 3M | Differential |
| RT Probe | 50～ 500K | Absolute |
| RT Probe | 50～ 500K | Differential |
| RT Probe | 500k～ 3M | Absolute |
| RT Probe | 500k～ 3M | Differential |
| Edge-purposed Probe | 50～ 500K | Differential |
| Edge-purposed Probe | 500k～ 3M | Differential |
| Surrounding Probe | 1k～ 50k | Customization |
| Penetrating Probe | 1k～ 50k | Customization |